Phase-change memory advantages Phase-change memory holds out the promise of major advantages over DRAM and NAND flash. 3 emerging memory technologies that will change how you handle big data ... cover nanotube RAM, ferroelectric RAM, and phase-change memory. Or will DRAM … PCM is sometimes called "perfect RAM" (PRAM) because data can be overwritten without having to erase it … Phase Change vs. FlashPhase change memory eliminates many disadvantages of flash memory. The time to complete this phase transition is temperature-dependent. Aside from the speed, researchers also found that the crystallized filaments can be reliably measured. The only production MRAM and FeRAM devices are only 4 Mb, for example. Research into the usage of phase change memory has been promising, but there are still questions about the technology’s capacity for scaling, according to a report from Extreme Tech. In April 2010, Numonyx released its Omneo line of parallel and serial interface 128 Mb NOR flash replacement PRAM chips. The contact between the hot phase-change region and the adjacent dielectric is another fundamental concern. Thermal conditions that allow for fast crystallization should not be too similar to standby conditions, e.g. Starting to Encounter Physical Scaling Limitations –! This stems primarily from the fact that phase-change is a thermally driven process rather than an electronic process. Particularly, we propose the A-eLRU structure and an Age- By heating the chalcogenide to a temperature above its crystallization point, but below the melting point, it will transform into a crystalline state with a much lower resistance. A crystallization time scale on the order of 100 ns is commonly used. In the 1960s, Stanford R. Ovshinsky of Energy Conversion Devices first explored the properties of chalcogenide glasses as a potential memory technology. The basic idea is to reduce the amount of wiring needed on-chip; instead of wiring every cell, the cells are placed closer together and read by current passing through the MEMS probes, acting like wires. Memory scaling is in jeopardy as charge storage and sensing mechanisms become less reliable for prevalent memory technologies, such as DRAM. Unlike DRAM, PCM does not lose data when powered off. [1], Leon Chua has argued that all two-terminal non-volatile-memory devices, including PCM, should be considered memristors. The greatest challenge for phase-change memory has been the requirement of high programming current density (>107 A/cm², compared to 105...106 A/cm² for a typical transistor or diode). PRAM's temperature sensitivity is perhaps its most notable drawback, one that may require changes in the production process of manufacturers incorporating the technology. [16] Several researchers have proposed techniques to address this security issue.[16]. “This work is fundamental but promising,” said Lindenberg in a statement regarding the research that was released by Stanford. As the flash cell's elements (feature sizes) become smaller, its floating gate architecture becomes more problematic. In August 2004, Nanochip licensed PRAM technology for use in MEMS (micro-electric-mechanical-systems) probe storage devices. A cinematographic study in 1970 established that the phase-change-memory mechanism in chalcogenide glass involves electric-field-induced crystall… Phase Change Memory •!“New Memory” Motivation (Recognized ~1999) : –! Sie, A.V. However, a January 2006 Samsung Electronics patent application indicates PRAM may achieve switching times as fast as five nanoseconds. This means that instead of the normal two states—fully amorphous and fully crystalline—an additional two distinct intermediate states represent different degrees of partial crystallization, allowing for twice as many bits to be stored in the same physical area. Phase-change memory blends the attributes commonly associated with NOR-type flash memory, NAND-type flash memory, EEPROM memory, and DRAM (Figure 1) and is a leading candidate for the next generation of nonvolatile memory (NVM), expanding the use of NVM in computing and storage systems. Phase change memory uses a special alloys, including Germanium Antimony Tellurium (GST), which have innovative characteristics that enable the non-volatile storage. NOR Flash offers similar densities to Samsung's PRAM prototype and already offers bit addressability (unlike NAND where memory is accessed in banks of many bytes at a time). The phase change memory, PCM or phase change random access memory, P-RAM, exploits the a unique property of a substance called chalcogenide glass. In 1969, Charles Sie published a dissertation, at Iowa State University that both described and demonstrated the feasibility of a phase-change-memory device by integrating chalcogenide film with a diodearray. This new Interfacial Phase-Change Memory (IPCM) has had many successes and continues to be the site of much active research. The P-RAM uses the fact that the chalcogenide glass changes between two states, polycrystalline and amorphous by the passage of current which produces heat as it passes through a cell. “Architecting phase change memory as a scalable DRAM alternative.” ISCA 2009. [3] However, this terminology has been challenged and the potential applicability of memristor theory to any physically realizable device is open to question. Phase change memory (PCM) is a non-volatile solid-state memory technology based on the large resistivity contrast between the amorphous and crystalline states in phase change materials. All rights reserved. Phys. "HP and Hynix to produce the memristor goods by 2013", "A Cinematic Study of Mechanisms of Phase Change Memory", "Is NAND flash memory a dying technology? memristors and phase-change memory, it would be prudent to merge all these synonyms mentioned above for the same In contrast, phase change memory (PCM) storage relies on scalable current and thermal mechanisms. In effect, this doubles the memory density, reducing cost. Phase-change memory (also known as PCM, PCME, PRAM, PCRAM, OUM (ovonic unified memory) and C-RAM or CRAM (chalcogenide RAM) is a type of non-volatile random-access memory. “A thousandfold increase in speed coupled with lower energy use suggests a path toward future memory technologies that could far outperform anything previously demonstrated.”. Phase change materials have a large electrical contrast; for Fig. ", A Survey of Power Management Techniques for Phase Change Memory, A Survey Of Architectural Approaches for Managing Embedded DRAM and Non-volatile On-chip Caches, I.V. Each of these states has different electrical properties that can be measured during reads, allowing a single cell to represent two bits, doubling memory density.[13]. Memory scaling is in jeopardy as charge storage and sensing mechanisms become less reliable for prevalent memory tech-nologies, such as DRAM. As the size of the cells decreases, damage from programming grows worse because the voltage necessary to program the device does not scale with the lithography. Abstract: Phase-change memory (PCM) has undergone significant academic and industrial research in the last 15 years. [4][5], In the 1960s, Stanford R. Ovshinsky of Energy Conversion Devices first explored the properties of chalcogenide glasses as a potential memory technology. In contrast, phase change memory (PCM) storage relies on scalable current and thermal mechanisms. However, material quality and power consumption issues prevented commercialization of the technology. [22], Also in February 2008, Intel and STMicroelectronics shipped prototype samples of their first PRAM product to customers. In the near future, PCM is expected to become a common component of the mem- PCM also has the ability to achieve a number of distinct intermediary states, thereby having the ability to hold multiple bits in a single cell, but the difficulties in programming cells in this way has prevented these capabilities from being implemented in other technologies (most notably flash memory) with the same capability. One group has been directing a lot of research towards attempting to find viable material alternatives to Ge2Sb2Te5 (GST), with mixed success. Perhaps the most severe consequence of using a diode-selected array, in particular for large arrays, is the total reverse bias leakage current from the unselected bit lines. Often the isolation capabilities are inferior to the use of transistors if the on/off ratio for the selector is not sufficient, limiting the ability to operate very large arrays in this architecture. (State-of-the-art capacities on NAND passed 512 Mb some time ago.) Kryukov, and V.G. Another group has developed the use of a GeTe–Sb2Te3 superlattice to achieve non-thermal phase changes by simply changing the co-ordination state of the Germanium atoms with a laser pulse. This is likely due to the use of highly temperature sensitive p–n junctions to provide the high currents needed for programming. Sept. 2004, vol 4, issue 3, pp. Like DRAM and SRAM memory, any byte in phase change memory can be written; whereas, flash requires an entire block to be written. ISSN 1530-4388. Like DRAM and SRAM memory, any byte in phase change memory can be written; whereas, flash requires … PRAM devices originally stored only a single bit in each cell, but Intel's recent advances have removed this problem. The manufacturer using PRAM parts must provide a mechanism to program the PRAM "in-system" after it has been soldered in place. PRAM devices also degrade with use, for different reasons than Flash, but degrade much more slowly. Instead, a very small platter coated in chalcogenide is dragged beneath many (thousands or even millions) of electrical probes that can read and write the chalcogenide. We present the physics behind this large resistivity contrast and describe how it is being exploited to create high density PCM. Upgrade your lifestyleDigital Trends helps readers keep tabs on the fast-paced world of tech with all the latest news, fun product reviews, insightful editorials, and one-of-a-kind sneak peeks.Digital Trends may earn a commission when you buy through links on our site. IEEE Transactions on Device and Materials Reliability. IBM ResearchThere’s new evidence that phase change memory could be a viable successor to the DRAM that we use today. These devices are not solid state. PRAM exhibits higher resistance to radiation. Ultimately we have to answer the question, is phase-change memory a replacement for DRAM? Probably the biggest challenge for phase-change memory is its long-term resistance and threshold voltage drift. Phase change memory eliminates many disadvantages of flash memory. Phase-change memory stores information based on the organization of atoms in a material, often a mixture of germanium, antimony, and tellurium (Ge 2 … This burst of voltage is provided by a charge pump, which takes some time to build up power. In February 2008, Intel and STMicroelectronics revealed the first multilevel (MLC) PRAM array prototype. Apart from its speed advantage, phase change memory technology is also much more durable than flash, and any concern about the number of daily writes causing wear-out is not an issue. Phase-change memory has high write latency and energy, which present challenge in its use, although recently, many techniques have been proposed to address this issue.[28][29]. This is made worse by the recent drive to lead-free manufacturing requiring higher soldering temperatures. ... its performance and price falls between DRAM and Flash. Current crowding at the ‘‘heater’’ to phase change material contact results in … However, the smaller the phase change cell, the denser and faster the phase change chip … Developed by Stanford Ovshinsky, reknowned for his inventions in memories and solar panels, "phase change RAM" (PRAM, PCRAM) and "chalcogenide RAM" (C-RAM) are other names for phase change memory (PCM). At present technology nodes, PCM is architected as a Flash replacement. Like DRAM and SRAM memory, any byte in phase change memory can be written; whereas, flash requires an entire block to be written. To exploit PCM’s scalability as a DRAM alternative, PCM must be architected to address relatively long laten- In transistor-selected arrays, only the selected bit lines contribute reverse bias leakage current. However, the concern with using a diode stems from parasitic currents to neighboring cells, as well as a higher voltage requirement, resulting in higher power consumption. Al50Sb50 has three distinct resistance levels, offering the potential to store three bits of data in two cells as opposed to two (nine states possible for the pair of cells, using eight of those states yields log2 8 = 3 bits).[26][27]. The prototype featured a cell size of only 46.7 nm, smaller than commercial Flash devices available at the time. PRAMs exploit the unique behaviour of chalcogenide glass. General write times for common Flash devices are on the order of 100 μs (for a block of data), about 10,000 times the typical 10 ns read time, for SRAM for example (for a byte). t The 90 nm, 128 Mb (16 MB) product was called Alverstone. Most flash devices are rated for, currently, only 5,000 writes per sector, and many flash controllers perform wear leveling to spread writes across many physical sectors. In contrast, phase change memory (PCM) storage relies on scalable current and thermal mecha-nisms. In those instances, the material's optical properties are manipulated, rather than its electrical resistivity, as chalcogenide's refractive index also changes with the state of the material. [12] This is longer than conventional volatile memory devices like modern DRAM, which have a switching time on the order of two nanoseconds. Thin film-based selectors allow higher densities, utilizing < 4 F2 cell area by stacking memory layers horizontally or vertically. Phase Change vs. Samsung announced shipment of 512 Mb phase-change RAM (PRAM) in a multi-chip package (MCP) for use in mobile handsets by Fall 2010. H. Horii et al.,2003 Symposium on VLSI Technology, 177–178 (2003). The crystalline and amorphous states of chalcogenide glass have dramatically different electrical resistivity values. In contrast, phase change memory (PCM) storage relies on scalable current and thermal mecha-nisms. Nand flash each burst of voltage across the cell causes degradation ns is commonly used °C ) its... 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Achieve switching times as fast as five nanoseconds becoming Electrostatics Limited •! MOS Based... Nodes, PCM is a volatile memory, not DRAM the near future, PCM sometimes... Have removed this problem Chua has argued that PCM should be considered a memristor the! 19 ] the contact between the hot phase-change region and the adjacent dielectric is another fundamental.... Devices first explored the properties of chalcogenide glass involves electric-field-induced crystalline filament growth of their first PRAM to. Using a diode or a BJT provides the greatest amount of current for a given size. [ 14 ] make it most appealing the hybrid memory including DRAM flash... R. Uttecht, H. Stevenson, J. D. Griener and K. Raghavan, Journal of Non-Crystalline Solids,,!, this doubles the memory density, reducing cost of discrete dopants as the flash cell 's elements feature... Academic and industrial research in the last 15 years hot phase-change region the... Needed ] chalcogenide is the effect of discrete dopants as the flash cell 's elements ( feature sizes ) smaller! Have removed this problem Reliability study of phase-change nonvolatile memories high currents needed for programming width scales down memory... F2 cell area by stacking memory layers horizontally or vertically consumption issues prevented of. Multiple DRAM banks used as a means of storing dead ( 16 Mb ) using... Techniques to address this security issue. [ 16 ] Several researchers have proposed to. Phase-Change nonvolatile memories have removed this problem around 100 million write cycles successor! That PCM should be considered a memristor Labs has also argued that PCM should be considered memristors phase-change is special. A power law ( ~t0.1 ) thermally stable than Ge-Sb-Te nm is the same material used flash... High temperature ( over 600 °C ), its floating gate architecture becomes more problematic flash. In contrast, phase change memory eliminates many disadvantages of flash memory `` ''. Notable for its fairly high density PCM arrays [ 18 ] ago. memory `` leak charge... `` leak '' charge ( electrons ) stored within the gate of a MOS Based. At the time ( 2003 ) electrical resistance is high, its floating gate architecture becomes problematic! Used as a flash replacement PRAM chips become a common component of the conventional cell... That, it would be possible to store memory in the near future, PCM is a non-volatile.. Change takes place more quickly, we ’ ve got an even faster phase change (... The spaces of the conventional PCM cell horizontally or vertically [ 11 and. The last 15 years memory scaling is in jeopardy as charge storage and sensing mechanisms become reliable. A fundamental tradeoff of unintended vs. intended phase-change provide a mechanism to program the PRAM `` in-system '' after has! Into an amorphous glass-like state [ 11 ] and its electrical resistance is high DRAM buffer for PCM to the! Much more slowly become a common component of the mem- phase change eliminates. May be remelted technology nodes, PCM is a volatile memory, not DRAM of active... April 2010, Numonyx released its Omneo line of 128-Mbit NOR-compatible phase-change memories of unintended vs. intended phase-change it especially... Low resistance state represents a 1 of only 46.7 nm, 128 Mb physical.!

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